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Characterization of particles
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:533 | ✔ Available |
Introduction to analytical electron microscopy
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TA417.23 .I57 | ✔ Available |