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Cover image for MEMS length and strain measurements using an optical interferometer

MEMS length and strain measurements using an optical interferometer

Location Call # Status
Joyner - Microforms B300 C 13.58:6779 ✔ Available
Cover image for Design and testing guides for the CMOS and lateral bipolar-on-SOI test library

Design and testing guides for the CMOS and lateral bipolar-on-SOI test library

Location Call # Status
Joyner - Microforms B300 C 13.10:400-93 ✔ Available