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Cover image for Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry

Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry

  • 1996
  • Format: Book
Location Call # Status
Joyner - Microforms B300 NAS 1.15:111685 ✔ Available
Cover image for Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry

Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry

Location Call # Status
Joyner - Microforms B300 NAS 1.15:112114 ✔ Available