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Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
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DC conductivity measurements of metals
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.46:1531 | ✔ Available |
Strategic plan for fiscal years 1999-2004
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:6285 | ✔ Available |
National Semiconductor Metrology Program
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.37:103/ 2000 | ✔ Available |
Programs, activities, and accomplishments
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58 | ✔ Available |
Programs, activities, and accomplishments
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58 | ✔ Available |
Measurements for competitiveness in electronics
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:4583 | ✔ Available |