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Cover image for Design of systems and circuits for maximum reliability or maximum production yield

Design of systems and circuits for maximum reliability or maximum production yield

Location Call # Status
Joyner - General Stacks TK7867 .B36 1977 ✔ Available
Cover image for Recognition of patterns using the frequencies of occurrence of binary words

Recognition of patterns using the frequencies of occurrence of binary words

Location Call # Status
Joyner - General Stacks Q327 .B4 1974 ✔ Available