Format: Print and Journal / Language: English / Location: Joyner Library / Publication Date: 1993 / Genre: Congresses - ECU Libraries Catalog Search Results

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ACM Sigmetrics Conference on Measurement and Modeling of Computer Systems : proceedings
by International Conference on Measurement and Modeling of Computer Systems
1993
Format: Book, Journal, and Print

✔ Available View 3 Items

Library	Location	Call Number	Status
Joyner	General Stacks	QA76.9.E94 I57 2003	✔ Available
Joyner	General Stacks	QA76.9.E94 I57 2004	✔ Available
Joyner	General Stacks	QA76.9.E94 I57 2005	✔ Available

Developments in school finance : fiscal proceedings from the Annual NCES State Data Conference
by NCES State Data Conference
1993
Format: Book, Journal, and Print

✔ Available Joyner - Fed Docs Stacks

Call Number: ED 1.302:SCH 6/21/ 997