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Cover image for Analysis of dimensional metrology standards

Analysis of dimensional metrology standards

  • 2001
  • Format: Microform
Location Call # Status
Joyner - Microforms B300 C 13.58:6847 ✔ Available
Cover image for Measurements & standards

Measurements & standards

  • 1998
  • Format: Book
Location Call # Status
Joyner - Fed Docs Stacks C 13.2:M 46/3 ✔ Available
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International activities

Location Call # Status
Joyner - Fed Docs Stacks C 13.58:79-1792 ✔ Available
Cover image for Proceedings of the 1997 Knowledge-based Systems Interoperability Workshop

Proceedings of the 1997 Knowledge-based Systems Interoperability Workshop

Location Call # Status
Joyner - Microforms B300 C 13.58:6111 ✔ Available
Cover image for FY ... programs and accomplishments, MSEL Materials for Micro- and Optoelectronics

FY ... programs and accomplishments, MSEL Materials for Micro- and Optoelectronics

Location Call # Status
Joyner - Microforms B300 C 13.58 ✔ Available
Cover image for FY ... programs and accomplishments

FY ... programs and accomplishments

Location
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Cover image for Polymers ... programs and accomplishments

Polymers ... programs and accomplishments

Location Call # Status
Joyner - Microforms B300 C 13.58 ✔ Available
Cover image for Polymers

Polymers

Location Call # Status
Joyner - Microforms B300 C 13.58 ✔ Available
Cover image for Technical activities

Technical activities

Location Call # Status
Joyner - Microforms B300 C 13.58 ✔ Available
Cover image for CERL Paint Laboratory

CERL Paint Laboratory

Location Call # Status
Joyner - Fed Docs Stacks D 103.2:P 16 ✔ Available